DeKal Technology (Tianjin) Co., Ltd
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    2-1203 Xinjin International, Xiqing District, Tianjin, China
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Research grade upright metallographic material Leica DM 4M microscope
Research grade upright metallographic material Leica DM 4M microscope
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迪卡尔科技(天津)有限公司

Research grade semi-automatic intelligent digital upright metallographic microscope, suitable for modular design of observation and analysis of samples such as metals, ceramics, polymer materials, electronic components, dust particles, etc. It can achieve reflection observation and transmission reflection observation configuration

Multi color correction optical path, the overall optical path supports a field of view diameter of 25 mm

6-hole objective disc, compatible with 32mm diameter industrial objective lens

Observation methods can achieve bright field, dark field, polarization, and interference

Built in LED transparent and reflective lighting power supply, intelligent light intensity control lighting mode, optional halogen lamp 12V 100W or 12V 50W light source

It can automatically remember the optimal light intensity, aperture size, and combination of focusing lenses under different objective lenses and observation modes, automatically restore to position, and operate quickly and easily. The machine base is equipped with a LCD display screen to display the working status and parameters of various components of the microscope

The adjustment of light intensity, aperture, observation mode, and spotlight can be controlled not only by buttons, but also by computers

Automatically add corresponding magnification scales to photos taken under different magnification objectives

Equipped with a constant color temperature system to improve work efficiency

Can be equipped with cameras and digital cameras for image acquisition, analysis, and measurement.

Can be equipped with fluorescence observation, high-temperature hot table, cathodoluminescence analyzer, photometer

Can be paired with 4x4, 6x6 large sample stage for observing large-sized samples such as silicon wafers

Can be equipped with an automatic scanning table for multi field non-metallic inclusions and particle size, cleanliness expert


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